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Profilometer
Supervisor: Cesare Melandri
Profilometer Bruker Contour GT-K
Bruker Contour GT-K is an interferometric profilometer and, as such, it guarantees high performances and non-invasive measures.
One interferometer is an instrument able of producing interference between two light beams generated by one single beam source. The coherent light ray is divided into two identical rays that will follow two different paths until recombining on the detector (CCD sensor). The difference of the optical path followed by each ray generates a phase change, which results in the interference figure.
The instrument is equipped with two magnification lenses 5 and 50x to enable higher variability as a function of the material and required analysis. Thanks to the high Z resolution, it is possible to carry out measures of thickness and topography of transparent materials, too. Roughness measures are allowed both in R and S mode.
Main technical features:
- High Z resolution.
- Motorized very-high precision table.
- Double magnification revolver, 5x and 50x.
- Non-contact measure of profile and roughness.
